报告题目：The quest for high performance cameras for advanced TEM applications
时间：9月14日下午3点
地点：唐楼B501
摘要：
Transmission electron microscopy (TEM) instrumentation has experienced a rapid growth phase in the last decade with the commercialization of aberration correctors. In addition great progress has also been made in wide variety of specimen holders for in-situ TEM applications. The new TEM instrumentation has resulted in increasing number of establishment of new TEM laboratories or equipment upgrade around the globe with the aim of engaging in world-class research and development for advanced materials.
The increased performance of these advanced TEM systems has presented great challenges to image detection system that is capable of capturing electron microscope image data with higher spatial/temporal resolution and preferably by using lower electron dose. As spatial and temporal resolutions improve the acquired image data volume would increase significantly. Consequently data storage and management will become more critical for a high performance image acquisition system. The design of advanced imaging systems must address issues of image resolution, sensitivity, and speed as well as data management.
High speed direct detection cameras using active CMOS (complementary metal-oxide- semiconductor) sensors have been successfully developed with exceptional performance for advanced TEM applications. In this presentation, a review will be given with recent examples in in-situ TEM and low dose imaging of microporous materials.
个人简介：
Dr. Ming Pan is the Senior Vice President of Business Development at Gatan, Inc. His electron microscopy career started with Prof. K.H. Kuo in 1982 at the Institute of Metal Research, Chinese Academy of Sciences in Shenyang. In 1984, he joined Prof. J.M. Cowley’s group at Arizona State University and received his Ph.D. degree in 1990. His research projects included study of nano-meter sized metal particles and their catalytic properties using electron nano-diffraction technique in STEM and high resolution TEM imaging. From 1990-1994, he was a research scientist in the Center for High Resolution Electron Microscopy (now the J.M. Cowley Center for HREM) at ASU. His research included the pioneering work of using digital imaging technique to image beam sensitive microporous materials in high resolution TEMs. In 1995 he joined Gatan and has since held various positions in product development, management, marketing, sales and business development.
